X-ray topography of hydride domains

S. R. Stock; R. Chasnov; H. D. Chen; H. K. Birnbaum

doi:10.1016/0167-577X(83)90063-0

X-ray topography of hydride domains

S. R. Stock^*, R. Chasnov, H. D. Chen, H. K. Birnbaum

^*此作品的通信作者

國際半導體產業學院

研究成果: Article › 同行評審

摘要

X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

原文	English
頁（從 - 到）	173-175
頁數	3
期刊	Materials Letters
卷	2
發行號	2
DOIs	https://doi.org/10.1016/0167-577X(83)90063-0
出版狀態	Published - 1 1月 1983

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10.1016/0167-577X(83)90063-0

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title = "X-ray topography of hydride domains",

abstract = "X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.",

author = "Stock, {S. R.} and R. Chasnov and Chen, {H. D.} and Birnbaum, {H. K.}",

year = "1983",

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T1 - X-ray topography of hydride domains

AU - Stock, S. R.

AU - Chasnov, R.

AU - Chen, H. D.

AU - Birnbaum, H. K.

PY - 1983/1/1

Y1 - 1983/1/1

N2 - X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

AB - X-ray topographic techniques were applied to the study of twin related domains in niobium hydride and deuteride crystals. It was shown that contrast between the domains, which results from small differences in orientation, allows the method to be used in the study of the domain behavior. The method is compared to the alternate technique of optical metallography.

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U2 - 10.1016/0167-577X(83)90063-0

DO - 10.1016/0167-577X(83)90063-0

M3 - Article

AN - SCOPUS:0020833234

VL - 2

SP - 173

EP - 175

JO - Materials Letters

JF - Materials Letters

SN - 0167-577X

IS - 2

ER -

X-ray topography of hydride domains

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