X-Ray absorption studies of boron-carbon-nitrogen (Bx CyNz) ternary alloys

S. C. Ray, H. M. Tsai, J. W. Chiou, J. C. Jan, Krishna Kumar, W. F. Pong*, F. Z. Chien, M. H. Tsai, S. Chattopadhyay, L. C. Chen, S. C. Chien, M. T. Lee, S. T. Lin, K. H. Chen

*此作品的通信作者

研究成果: Article同行評審

21 引文 斯高帕斯(Scopus)

摘要

X-Ray diffraction (XRD) and B, N and C K-edges X-ray absorption near-edge structure (XANES) measurements have been performed to study the BxCyNz ternary compounds. XRD reveals that the films contain carbon nitride, boron carbide, and boron nitride compounds. The combination of B, N and C K-edges XANES results reveal the presence of B-N, B-C, N-C, and C-N local bonding structures in Bx CyNz, indicating that boron-carbon-nitride thin films have a ternary phase, rather than a mixture of segregated binary phases.

原文English
頁(從 - 到)1553-1557
頁數5
期刊Diamond and Related Materials
13
發行號4-8
DOIs
出版狀態Published - 4月 2004

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