Wafer-level 3D integration technology
- Steven J. Koester*
- , Albert M. Young
- , Roy R. Yu
- , Sampath Purushothaman
- , Kuan-Neng Chen
- , Douglas C. La Tulipe
- , Narender Rana
- , Leathen Shi
- , Matthew R. Wordeman
- , Edmund J. Sprogis
*此作品的通信作者
研究成果: Review article › 同行評審
172
引文
斯高帕斯(Scopus)