VIA-4 Avalanche-Induced Breakdown Mechanisms in Short-Channel MOSFETs

F. C. Hsu, P. K. Ko, S. Tam, Chen-Ming Hu, R. S. Muller

研究成果: Article › 同行評審

8 引文斯高帕斯（Scopus）

原文	English
頁（從 - 到）	1702-1703
頁數	2
期刊	IEEE Transactions on Electron Devices
卷	29
發行號	10
DOIs	https://doi.org/10.1109/T-ED.1982.20998
出版狀態	Published - 1 1月 1982

存取文件

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AU - Muller, R. S.

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