Variations of differential capacitance in SrBi 2 Ta 2 O 9 ferroelectric films induced by photoperturbation

Ching Chich Leu*, Chao-Hsin Chien, Chih Yuan Chen, Mao Nan Chang, Fan Yi Hsu, Chen Ti Hu, Yung-Fu Chen

*此作品的通信作者

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

摘要

In this letter, we demonstrated the impact of illumination on the differential capacitance variation of a strontium bismuth tantalite (SBT) capacitor during scanning capacitance microscopy measurements. It was found that illumination with a stray light of laser in an atomic force microscope could perturb the dC/dV signals of the samples. We attribute this phenomenon to the generation of free carriers by the photon absorptions via defect traps in the SBT thin film. Therefore, this present work suggests that the effect of laser illumination must be carefully taken into consideration whenever a field-sensitive technique is employed to analyze the properties of a ferroelectric material.

原文English
文章編號092906
頁(從 - 到)1-3
頁數3
期刊Applied Physics Letters
86
發行號9
DOIs
出版狀態Published - 28 2月 2005

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