Unknown-tolerance analysis and test-quality control for test response compaction using space compactors

Chia-Tso Chao*, Kwang Ting Cheng, Seongmoon Wang, Srimat Chakradhar, Wen Long Wei

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. aliasing). In this paper, we first propose a mathematical framework to estimate the percentage of observable responses under unknown-induced masking for a space compactor. We further develop a prediction scheme which can correlate the percentage of observable responses with the modeled-fault coverage and with a n-detection metric for a given test set. As a result, the quality of a space compactor can be measured directly based on its test quality, instead of based on indirect metrics such as the number of tolerated unknowns or the aliasing probability. With the prediction scheme above, we propose a construction flow for space compactors to achieve the desired level of test quality while maximizing the compaction ratio.

    原文English
    主出版物標題2006 43rd ACM/IEEE Design Automation Conference, DAC'06
    發行者Institute of Electrical and Electronics Engineers Inc.
    頁面1083-1088
    頁數6
    ISBN(列印)1595933816, 1595933816, 9781595933812
    DOIs
    出版狀態Published - 2006
    事件43rd Annual Design Automation Conference, DAC 2006 - San Francisco, CA, United States
    持續時間: 24 7月 200628 7月 2006

    出版系列

    名字Proceedings - Design Automation Conference
    ISSN(列印)0738-100X

    Conference

    Conference43rd Annual Design Automation Conference, DAC 2006
    國家/地區United States
    城市San Francisco, CA
    期間24/07/0628/07/06

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