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Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution

    研究成果: Conference contribution › 同行評審

    7 引文 斯高帕斯（Scopus）

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    深入研究「Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution」主題。共同形成了獨特的指紋。
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    Engineering