Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration

Yu Hsien Lee; Atsushi Yabushita; Chain-Shu Hsu; Sheng-Hsiung Yang; Izumi Iwakura; Chih-Wei Luo; Kaung-Hsiung Wu; Takayoshi Kobayashi

doi:10.1016/j.cplett.2010.08.036

Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration

Yu Hsien Lee, Atsushi Yabushita, Chain-Shu Hsu, Sheng-Hsiung Yang, Izumi Iwakura, Chih-Wei Luo, Kaung-Hsiung Wu, Takayoshi Kobayashi

研究成果: Article › 同行評審

15 引文斯高帕斯（Scopus）

摘要

Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be τ_GR = 90 ± 2 fs. The relaxation time constant of BPP was determined as τ_BPP = 710 ± 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film.

原文	English
頁（從 - 到）	71-76
頁數	6
期刊	Chemical Physics Letters
卷	498
發行號	1-3
DOIs	https://doi.org/10.1016/j.cplett.2010.08.036
出版狀態	Published - 30 9月 2010

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10.1016/j.cplett.2010.08.036

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title = "Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration",

abstract = "Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be τGR = 90 ± 2 fs. The relaxation time constant of BPP was determined as τBPP = 710 ± 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film.",

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T1 - Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration

AU - Lee, Yu Hsien

AU - Yabushita, Atsushi

AU - Hsu, Chain-Shu

AU - Yang, Sheng-Hsiung

AU - Iwakura, Izumi

AU - Luo, Chih-Wei

AU - Wu, Kaung-Hsiung

AU - Kobayashi, Takayoshi

PY - 2010/9/30

Y1 - 2010/9/30

N2 - Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be τGR = 90 ± 2 fs. The relaxation time constant of BPP was determined as τBPP = 710 ± 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film.

AB - Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be τGR = 90 ± 2 fs. The relaxation time constant of BPP was determined as τBPP = 710 ± 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film.

UR - https://www.scopus.com/pages/publications/77957018032

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DO - 10.1016/j.cplett.2010.08.036

M3 - Article

AN - SCOPUS:77957018032

SN - 0009-2614

VL - 498

SP - 71

EP - 76

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 1-3

ER -

Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration

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