摘要
An ultra-thin body SOI nMOSFET is demonstrated as a promising structure for deep-sub-tenth micron CMOS technology. 40nm channel length is achieved with the ultra-thin body which suppresses the short-channel effect. A 12nm-gate-length CMOS should be attainable if a 4nm ultra-thin body is used.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 919-921 |
| 頁數 | 3 |
| 期刊 | Technical Digest - International Electron Devices Meeting |
| DOIs | |
| 出版狀態 | Published - 1999 |
| 事件 | 1999 IEEE International Devices Meeting (IEDM) - Washington, DC, USA 持續時間: 5 12月 1999 → 8 12月 1999 |