摘要
An ultra-thin body SOI nMOSFET is demonstrated as a promising structure for deep-sub-tenth micron CMOS technology. 40nm channel length is achieved with the ultra-thin body which suppresses the short-channel effect. A 12nm-gate-length CMOS should be attainable if a 4nm ultra-thin body is used.
原文 | English |
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頁(從 - 到) | 919-921 |
頁數 | 3 |
期刊 | Technical Digest - International Electron Devices Meeting |
DOIs | |
出版狀態 | Published - 1999 |
事件 | 1999 IEEE International Devices Meeting (IEDM) - Washington, DC, USA 持續時間: 5 12月 1999 → 8 12月 1999 |