Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes

Fu Jen Kao*, Mao Kuo Huang, Yung Shun Wang, Sheng Lung Huang, Ming Kwei Lee, Chi Kuang Sun, Ping chin Cheng

*此作品的通信作者

研究成果同行評審

4 引文 斯高帕斯(Scopus)

摘要

In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single-photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.

原文English
頁(從 - 到)92-98
頁數7
期刊Proceedings of SPIE - The International Society for Optical Engineering
4082
DOIs
出版狀態Published - 2000
事件Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications - Taipei, Taiwan
持續時間: 26 7月 200028 7月 2000

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