摘要
We have studied the effects of oxygen defects in CuO2 planes by 80 keV electron irradiation on YBCO thin films. Similar to the results of Zn-doped YBCO, a significant increase in residual resistivity accompanies Tc suppression, and the relation could be described in the framework of pair-breaking. However, the Tc suppression rate is three times as slow as predicted by d-wave pairing symmetry. For irradiated samples, (dHc2/dT) near Tc is consistent with the scenario of double pair-breaking, in contrast to the case of Pr-doped YBCO.
原文 | English |
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頁(從 - 到) | 1187-1188 |
頁數 | 2 |
期刊 | Czechoslovak Journal of Physics |
卷 | 46 |
發行號 | SUPPL. 3 |
DOIs | |
出版狀態 | Published - 1 12月 1996 |