@inproceedings{99be1062eb934248adf1c5cae35afa45,
title = "Transparent amorphous oxide semiconductors for system on panel applications",
abstract = "We demonstrate the applications of amorphous InGaZnO thin film transistor (a- IGZO TFT), extended from the pixel switcher/current driver, gate driver on array (GOA) to resistive random access memory (RRAM) technologies for system-on-panels (SoPs). The high-performance IGZO TFT with mobility of 13.5 cm2/Vs is proposed by microwave annealing process at room temperature only for 100 sec. Furthermore, an integrated gate driver scheme with the a-IGZO TFT as backbone is demonstrated in comparison with the amorphous Si TFT backplane. The rise and fall time of a-IGZO gate driver circuits is shorter than that of a-Si TFT gate driver. In addition, the ASK demodulator with a-IGZO TFT is realized successfully, and potentially to be applied for the system of low-frequency RFID tag. The study on a-IGZO RRAM reveals excellent reliability including 1000 times DC sweep endurance, 104 pulse endurance, 104 s data retention with read disturb immunity. The flexibility of a-IGZO RRAM device is also examined for flexible electronics applications.",
author = "Po-Tsun Liu and Chu, {Li Wei} and Teng, {Li Feng} and Fan, {Yang Shun} and Fuh, {Chur Shyang}",
year = "2013",
month = jan,
day = "1",
doi = "10.1149/05008.0257ecst",
language = "English",
isbn = "9781607683568",
volume = "50",
series = "ECS Transactions",
number = "8",
pages = "257--268",
booktitle = "Thin Film Transistors 11, TFT 2012",
edition = "8",
note = "null ; Conference date: 08-10-2012 Through 10-10-2012",
}