@inproceedings{4181129324cd4ff98fc63d3924ef5a70,
title = "Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System with CMOS ICs under System-Level ESD Test",
abstract = "Transient voltage suppressor (TVS) has been widely used on the PCB to protect the microelectronics system against the system-level electrostatic discharge (ESD) events. However, the signal integrity of the system operations may be destroyed after the system-level ESD test, if the TVS was designed with a holding voltage lower than the operating voltage of CMOS ICs those equipped in the system. In this work, the signal integrity of microelectronics system protected by the TVS with different holding voltages was studied under the system-level ESD test. By monitoring the transient voltage waveforms in the time domain during system-level ESD test, the system malfunction has been found when the TVS is with a lower holding voltage. Therefore, the holding voltage of TVS must be greater than the system operating voltage to keep the well signal integrity in the applications. ",
keywords = "holding voltage, signal integrity, system-level ESD, Transient voltage suppressor (TVS)",
author = "Shen, {Yu Shu} and Ker, {Ming Dou} and Jiang, {Hsin Chin}",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020 ; Conference date: 20-07-2020 Through 23-07-2020",
year = "2020",
month = jul,
day = "20",
doi = "10.1109/IPFA49335.2020.9261022",
language = "English",
series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2020",
address = "United States",
}