@inproceedings{b6143d6229004452aa6eb5cd20b63cc2,
title = "Transient-to-digital converter for protection design in CMOS integrated circuits against electrical fast transient",
abstract = "An on-chip transient-to-digital converter for protection design against electrical fast transient (EFT) is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients under EFT tests. The output digital codes can correspond to different EFT voltages during the EFT-induced transient disturbances. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.",
keywords = "Converter, Electrical fast transient (EFT) test, Transient detection circuit",
author = "Yen, {Cheng Cheng} and Ming-Dou Ker and Liao, {Chi Sheng} and Chen, {Tung Yang} and Tsai, {Chih Chung}",
year = "2009",
month = dec,
day = "1",
doi = "10.1109/ISEMC.2009.5284683",
language = "English",
isbn = "9781424442676",
series = "IEEE International Symposium on Electromagnetic Compatibility",
pages = "41--44",
booktitle = "2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009",
note = "2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 ; Conference date: 17-08-2009 Through 21-08-2009",
}