Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker; Cheng Cheng Yen; Chi Sheng Liao; Tung Yang Chen; Chih Chung Tsai

doi:10.1109/ASSCC.2008.4708814

Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker^*, Cheng Cheng Yen, Chi Sheng Liao, Tung Yang Chen, Chih Chung Tsai

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

2 引文斯高帕斯（Scopus）

摘要

An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

原文	English
主出版物標題	Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
頁面	409-412
頁數	4
DOIs	https://doi.org/10.1109/ASSCC.2008.4708814
出版狀態	Published - 2008
事件	2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 - Fukuoka, Japan 持續時間: 3 11月 2008 → 5 11月 2008

出版系列

名字	Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Conference

Conference	2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
國家/地區	Japan
城市	Fukuoka
期間	3/11/08 → 5/11/08

存取文件

10.1109/ASSCC.2008.4708814

其它文件與鏈接

Link to publication in Scopus

引用此

Ker, M.-D., Yen, C. C., Liao, C. S., Chen, T. Y., & Tsai, C. C. (2008). Transient-to-digital converter for ESD protection design in microelectronic systems. 於 Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 (頁 409-412). 文章 4708814 (Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008). https://doi.org/10.1109/ASSCC.2008.4708814

@inproceedings{c1d74f3138d74ef4aaefec4b5b03c2d5,

title = "Transient-to-digital converter for ESD protection design in microelectronic systems",

abstract = "An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.",

author = "Ming-Dou Ker and Yen, {Cheng Cheng} and Liao, {Chi Sheng} and Chen, {Tung Yang} and Tsai, {Chih Chung}",

year = "2008",

doi = "10.1109/ASSCC.2008.4708814",

language = "English",

isbn = "9781424426058",

series = "Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008",

pages = "409--412",

booktitle = "Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008",

note = "2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 ; Conference date: 03-11-2008 Through 05-11-2008",

}

Ker, M-D, Yen, CC, Liao, CS, Chen, TY & Tsai, CC 2008, Transient-to-digital converter for ESD protection design in microelectronic systems. 於 Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008., 4708814, Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008, 頁 409-412, 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008, Fukuoka, Japan, 3/11/08. https://doi.org/10.1109/ASSCC.2008.4708814

Transient-to-digital converter for ESD protection design in microelectronic systems. / Ker, Ming-Dou; Yen, Cheng Cheng; Liao, Chi Sheng 等.
Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008. 2008. p. 409-412 4708814 (Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008).

研究成果: Conference contribution › 同行評審

TY - GEN

T1 - Transient-to-digital converter for ESD protection design in microelectronic systems

AU - Ker, Ming-Dou

AU - Yen, Cheng Cheng

AU - Liao, Chi Sheng

AU - Chen, Tung Yang

AU - Tsai, Chih Chung

PY - 2008

Y1 - 2008

N2 - An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

AB - An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

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U2 - 10.1109/ASSCC.2008.4708814

DO - 10.1109/ASSCC.2008.4708814

M3 - Conference contribution

AN - SCOPUS:67649967902

SN - 9781424426058

T3 - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

SP - 409

EP - 412

BT - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

T2 - 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Y2 - 3 November 2008 through 5 November 2008

ER -

Transient-to-digital converter for ESD protection design in microelectronic systems

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Conference

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