Topology-driven cell layout migration with collinear constraints

De Shiun Fu*, Ying Zhih Chaung, Yen Hung Lin, Yih-Lang Li

*此作品的通信作者

研究成果: Conference contribution同行評審

7 引文 斯高帕斯(Scopus)

摘要

Traditional layout migration focuses on area minimization, thus suffered wire distortion, which caused loss of layout topology. A migrated layout inheriting original topology owns original design intention and predictable property, such as wire length which determines the path delay importantly. This work presents a new rectangular topological layout to preserve layout topology and combine its flexibility of handling wires with traditional scan-line based compaction algorithm for area minimization. The proposed migration flow contains devices and wires extraction, topological layout construction, unidirectional compression combining scan-line algorithm with collinear equation solver, and wire restoration. Experimental results show that cell topology is well preserved, and a several times runtime speedup is achieved as compared with recent migration research based on ILP (integer linear programming) formulation.

原文English
主出版物標題2009 IEEE International Conference on Computer Design, ICCD 2009
頁面439-444
頁數6
DOIs
出版狀態Published - 1 十二月 2009
事件2009 IEEE International Conference on Computer Design, ICCD 2009 - Lake Tahoe, CA, United States
持續時間: 4 十月 20097 十月 2009

出版系列

名字Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
ISSN(列印)1063-6404

Conference

Conference2009 IEEE International Conference on Computer Design, ICCD 2009
國家/地區United States
城市Lake Tahoe, CA
期間4/10/097/10/09

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