摘要
Using total internal reflection, the possibility of a subnanosecond fluorescence spectroscopy for elucidating photophysical and photochemical processes of polymer surface is demonstrated. The thickness which can be studied under the present experimental conditions is of the order of 0.01 μm.
| 原文 | English |
|---|---|
| 頁（從 - 到） | 415-419 |
| 頁數 | 5 |
| 期刊 | Chemical Physics Letters |
| 卷 | 100 |
| 發行號 | 5 |
| DOIs | |
| 出版狀態 | Published - 23 8月 1983 |