Time-Resolved Carrier Dynamics near the Insulator - Metal Transition

M. J. Feldstein*, C. D. Keating, W. Zheng, Ian Liau, A. G. MacDiarmid, Michael J. Natan, N. F. Scherer


研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)


Carrier dynamics in polyaniline and colloidal Au films have been examined using a combined approach of time resolved laser spectroscopy and atomic force microscopy (AFM) These systems exhibit insulator-metal transitions (IMT) in conjunction with synthetic modification of their structure The relationship between structure and reactivity, in terms of hot carrier lifetimes and transport, has been identified by correlating changes in the dynamics with the directly measured morphology. Physical insight into the processes affecting carrier lifetimes and localization and the nature of the IMT has been derived from an analysis of the experimental data. The results and conclusions presented herein have implications for directing research and development in device applications based on thin film technologies.

頁(從 - 到)141-151
期刊ACS Symposium Series
出版狀態Published - 1 12月 1997


深入研究「Time-Resolved Carrier Dynamics near the Insulator - Metal Transition」主題。共同形成了獨特的指紋。