Time-dependent Multiple Gate Voltage Reliability of Hybrid Ferroelectric Charge Trap Gate Stack (FEG) GaN HEMT for Power Device Applications
- Shivendra K. Rathaur
- , Tsung Ying Yang
- , Chih Yi Yang
- , Edward Yi Chang
- , Heng Tung Hsu
- , Abhisek Dixit
研究成果: Conference contribution › 同行評審
4
引文
斯高帕斯（Scopus）