Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

研究成果: Paper同行評審

2 引文 斯高帕斯(Scopus)

摘要

We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.

原文American English
DOIs
出版狀態Published - 4 9月 2018
事件23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018 - Lausanne, Switzerland
持續時間: 29 7月 20182 8月 2018

Conference

Conference23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018
國家/地區Switzerland
城市Lausanne
期間29/07/182/08/18

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