THz emission from InN

Hyeyoung Ahn*, Yi Jou Ye, Yu Liang Hong, Shangjr Gwo

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

We report the terahertz (THz) emission from the wurzite indium nitride (InN) films grown by molecular beam epitaxy (MBE). More than two orders of magnitude of THz power enhancement has been achieved from the InN film grown along the a-axis and magnesium (Mg) doped InN with a critical carrier concentration. The primary radiation mechanism of the a-plane InN film is found to be due to the acceleration of photoexcited carriers under the polarization-induced in-plane electric field perpendicular to the a-axis. Apparent azimuthal angle dependences of THz wave amplitude and the second harmonic generation are observed from a-plane InN. In the Mg-doped films, Mg as the acceptors compensate the native donors in the InN films and large band bending over a wider space-charge region causes the enhancement of THz emission power compared to the undoped InN.

原文English
主出版物標題III-Nitride Materials for Sensing, Energy Conversion and Controlled Light-Matter Interactions
頁面141-150
頁數10
DOIs
出版狀態Published - 7 7月 2010
事件2009 MRS Fall Meeting - Boston, MA, 美國
持續時間: 30 11月 20094 12月 2009

出版系列

名字Materials Research Society Symposium Proceedings
1202
ISSN(列印)0272-9172

Conference

Conference2009 MRS Fall Meeting
國家/地區美國
城市Boston, MA
期間30/11/094/12/09

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