Three dimensional compressive strain and its effect on optical properties of GaN-based light emitting diode grown on patterned sapphire substrate by confocal spectromicroscopy

Heng Li, Hui Yu Cheng, Wei Liang Chen, Yi Hsin Huang, Chi Kang Li, Chiao Yun Chang, Yuh Renn Wu, Tien-chang Lu, Yu Ming Chang

研究成果: Conference contribution同行評審

摘要

We performed depth-resolved spectral mappings of GaN-based LED and results showed that the strain distribution propagating from PSS-GaN heterointerface toward surface and the PL intensity are spatially correlated. Numerical simulation based on indium composition distribution led to a radiative recombination rate distribution shows agreement with the experimental PL intensity distribution.

原文English
主出版物標題22nd Microoptics Conference, MOC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面308-309
頁數2
ISBN(電子)9784863486096
DOIs
出版狀態Published - 19 11月 2017
事件22nd Microoptics Conference, MOC 2017 - Tokyo, Japan
持續時間: 19 11月 201722 11月 2017

出版系列

名字22nd Microoptics Conference, MOC 2017
2017-November

Conference

Conference22nd Microoptics Conference, MOC 2017
國家/地區Japan
城市Tokyo
期間19/11/1722/11/17

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