The single particle tracking system

Ai Tang Chang*, Yi Ren Chang, Sien Chi, Long Hsu

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

In an optical tweezers system, the force measurement with a resolution less than pico-Newton can be achieved by precise measurement and analysis of the trapped particle trajectory. Typically, this single particle tracking technique is realized by a quadrant position sensor which detects the scattering lights of the trapping laser beam from the trapped particle. However, as the radius of the trapped particle is larger than the wavelength of the trapped laser, the scattering pattern becomes complicated, and it limits the tracking region and the signal sensitivity on the trapped particle. To solve this issue, an extra probing laser with optimized focal offset according to the trapping laser is applied to improve the flexibility and performance of our particle tracking system for each particle size. A rule of thumb between the optimized focal offsets and particle size is also concluded from the experimental results and theoretical simulations.

原文English
主出版物標題Optical Trapping and Optical Micromanipulation VII
DOIs
出版狀態Published - 27 10月 2010
事件Optical Trapping and Optical Micromanipulation VII - San Diego, CA, United States
持續時間: 1 8月 20105 8月 2010

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7762
ISSN(列印)0277-786X

Conference

ConferenceOptical Trapping and Optical Micromanipulation VII
國家/地區United States
城市San Diego, CA
期間1/08/105/08/10

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