The polarity dependence of ONO thickness for wrapped-select-gate (WSG) SONOS memory

Kuan Ti Wang*, Tien-Sheng Chao, Woei Cherng Wu, Chao Sung Lai

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

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Engineering & Materials Science