The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

D. R. Islamov*, T. V. Perevalov, V. A. Gritsenko, V. Sh Aliev, A. A. Saraev, V. V. Kaichev, E. V. Ivanova, M. V. Zamoryanskaya, A. Chin

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2 引文 斯高帕斯（Scopus）

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Material Science