The Impact of Thermal Noise in Multi-Domain Hf-based Antiferroelectric Material: Phase Transition and Endurance Performance

Sheng Luo, Zijie Zheng, Zuopu Zhou, Xiao Gong, Gengchiau Liang*

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

The deterioration of the endurance performance in the Hf-based antiferroelectric (AFE) material has been a crucial challenge in the reliability of its device applications. In this work, we propose a stochastic dynamic scheme to model the fatigue behaviors induced by thermal noise. Through the analysis of noise-induced phase transitions, we point out the impact of thermal effects on endurance, for which the mechanism is independent of defects/traps and is in good agreement with the experimental results. The complex interplay between the thermal noise and the domain dynamics provides a unique insight into the reliability and recovery strategy.

原文English
主出版物標題2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350360349
DOIs
出版狀態Published - 2024
事件2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Hsinchu, 台灣
持續時間: 22 4月 202425 4月 2024

出版系列

名字2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings

Conference

Conference2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024
國家/地區台灣
城市Hsinchu
期間22/04/2425/04/24

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