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The Impact of Nano Device Parameters Variations and Scaling Strategy for High Frequency Performance Enhancement in Nanoscale CMOS
Adhi Cahyo Wijaya, Jinq Min Lin,
Jyh Chyurn Guo
電子研究所
電機工程學系
研究成果
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Conference contribution
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Keyphrases
Nanoscale CMOS
100%
NMOSFET
100%
Nanodevices
100%
Performance Enhancement
100%
High-frequency Performance
100%
Parameter Variation
100%
Device Parameters
100%
Multiple Fingers
100%
Scaling Strategies
100%
Parameter Scaling
100%
Channel Current
50%
Process Variation
50%
Transconductance
50%
DC Characteristics
50%
Cut-off Frequency
50%
Circuit Performance
50%
Logic Circuit
50%
Nanoscale Devices
50%
Parameter Extraction
50%
Gate Capacitance
50%
De-embedding
50%
High Frequency Parameters
50%
High Frequency Characterization
50%
Engineering
Nanoscale
100%
Parameter Variation
100%
Experimental Result
50%
Cutoff Frequency
50%
Logic Circuit
50%
Circuit Performance
50%
Gate Capacitance
50%
Frequency Characterization
50%
Process Variation
50%
Material Science
Electronic Circuit
100%
Capacitance
100%
Nanodevice
100%
Parameter Extraction
100%