The fault detection of cross-check test scheme for infrared FPA

Meng Lieh Sheu; Tai Ping Sun; Chi Wen Lu; Mon Chau Shie

doi:10.1109/ISCAS.2003.1206372

The fault detection of cross-check test scheme for infrared FPA

Meng Lieh Sheu, Tai Ping Sun, Chi Wen Lu, Mon Chau Shie

照明與能源光電研究所

研究成果 › 同行評審

摘要

The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.

原文	English
頁（從 - 到）	V553-V556
期刊	Proceedings - IEEE International Symposium on Circuits and Systems
卷	5
DOIs	https://doi.org/10.1109/ISCAS.2003.1206372
出版狀態	Published - 2003
事件	Proceedings of the 2003 IEEE International Symposium on Circuits and Systems - Bangkok, 泰國持續時間: 25 5月 2003 → 28 5月 2003

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10.1109/ISCAS.2003.1206372

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title = "The fault detection of cross-check test scheme for infrared FPA",

abstract = "The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.",

keywords = "Cross-Check Test, FPA, Fault Model, Readout",

author = "Sheu, \{Meng Lieh\} and Sun, \{Tai Ping\} and Lu, \{Chi Wen\} and Shie, \{Mon Chau\}",

year = "2003",

doi = "10.1109/ISCAS.2003.1206372",

language = "English",

volume = "5",

pages = "V553--V556",

journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

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publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 2003 IEEE International Symposium on Circuits and Systems ; Conference date: 25-05-2003 Through 28-05-2003",

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T1 - The fault detection of cross-check test scheme for infrared FPA

AU - Sheu, Meng Lieh

AU - Sun, Tai Ping

AU - Lu, Chi Wen

AU - Shie, Mon Chau

PY - 2003

Y1 - 2003

N2 - The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.

AB - The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.

KW - Cross-Check Test

KW - FPA

KW - Fault Model

KW - Readout

UR - https://www.scopus.com/pages/publications/0038757999

U2 - 10.1109/ISCAS.2003.1206372

DO - 10.1109/ISCAS.2003.1206372

M3 - Conference article

AN - SCOPUS:0038757999

SN - 0271-4310

VL - 5

SP - V553-V556

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

T2 - Proceedings of the 2003 IEEE International Symposium on Circuits and Systems

Y2 - 25 May 2003 through 28 May 2003

ER -

The fault detection of cross-check test scheme for infrared FPA

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