The fault detection of cross-check test scheme for infrared FPA

Meng Lieh Sheu, Tai Ping Sun, Chi Wen Lu, Mon Chau Shie

研究成果: Conference article同行評審

摘要

The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.

原文English
頁(從 - 到)V553-V556
期刊Proceedings - IEEE International Symposium on Circuits and Systems
5
DOIs
出版狀態Published - 2003
事件Proceedings of the 2003 IEEE International Symposium on Circuits and Systems - Bangkok, Thailand
持續時間: 25 5月 200328 5月 2003

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