The Failure Mechanism of the Guard-Rings in Two Different Power Domains during the Latch-Up Test

Jian Hsing Lee*, Chih Hsuan Lin, Karuna Nidhi, Chao Yang Chen, Yeh Ning Jou, Ming Dou Ker

*此作品的通信作者

研究成果: Conference contribution › 同行評審

2 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering