@inproceedings{ae0e4a630ff748deb4913f622a88a7e6,
title = "The Correlations between ESD and TLP in Large Array Devices",
abstract = "Transmission Line Pulse (TLP) is often applied for Electrostatic Discharge (ESD) devices' characteristics researches. It indicates the devices' triggering-on behaviors, holding performances and thermal run-away results. In normal cases, the thermal run-away data should correlate to ESD [1]. However, the non-correlations between TLP and ESD can be observed in the gate driving circuits [2], silicide devices [3] and poly fuses [4]. In this paper, analyses for the relations between ESD and TLP are taken into discussions for large array devices (LAD).",
author = "Huang, \{Shao Chang\} and Li, \{Ching Ho\} and Chen, \{Li Fan\} and Chen, \{Chun Chih\} and Lin, \{Ting You\} and Hsu, \{Kai Chieh\} and Lin, \{Gong Kai\} and Lee, \{Jian Hsing\} and Kao, \{Yu Yung\} and Ke-Horng Chen",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 7th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2020 ; Conference date: 28-09-2020 Through 30-09-2020",
year = "2020",
month = sep,
day = "28",
doi = "10.1109/ICCE-Taiwan49838.2020.9258305",
language = "English",
series = "2020 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2020 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2020",
address = "美國",
}