Testing process precision for truncated normal distributions

W.l. Pearn*, Hui-Nien Hung, Nan Fu Peng, C. Y. Huang

*此作品的通信作者

研究成果: Article同行評審

12 引文 斯高帕斯(Scopus)

摘要

Process precision index Cp has been widely used in the manufacturing industry to provide numerical measures of process precision, which essentially reflects product quality consistency. Precision measures using Cp for normal processes, contaminated normal processes, have been investigated extensively, but are neglected for truncated normal processes. Truncated normal processes are common in the manufacturing industry, particularly, for factories equipped with automatic machines handling fully inspections, and scrap/rework products falling outside the specification limits. If the processes follow the normal distribution, then the inspected products (processes) must follow the truncated normal distribution. In this note, we consider the precision measure for truncated normal processes. We investigate the analytically intractable sampling distribution of the estimated Cp, and obtain a rather accurate approximation. Using the results, we develop a practical testing procedure for practitioners to use in their in-plant applications.

原文English
頁(從 - 到)2275-2281
頁數7
期刊Microelectronics Reliability
47
發行號12
DOIs
出版狀態Published - 1 12月 2007

指紋

深入研究「Testing process precision for truncated normal distributions」主題。共同形成了獨特的指紋。

引用此