Testing process capability based on C pm in the presence of random measurement errors

W.l. Pearn, M. H. Shu*, B. M. Hsu

*此作品的通信作者

    研究成果: Article同行評審

    28 引文 斯高帕斯(Scopus)

    摘要

    Process capability indices have been widely used in the manufacturing industry providing numerical measures on process performance. The index C p provides measures on process precision (or product consistency). The index C pm , sometimes called the Taguchi index, meditates on process centring ability and process loss. Most research work related to C p and C pm assumes no gauge measurement errors. This assumption insufficiently reflects real situations even with highly advanced measuring instruments. Conclusions drawn from process capability analysis are therefore unreliable and misleading. In this paper, we conduct sensitivity investigation on process capability C p and C pm in the presence of gauge measurement errors. Due to the randomness of variations in the data, we consider capability testing for C p and C pm to obtain lower confidence bounds and critical values for true process capability when gauge measurement errors are unavoidable. The results show that the estimator with sample data contaminated by the measurement errors severely underestimates the true capability, resulting in imperceptible smaller test power. To obtain the true process capability, adjusted confidence bounds and critical values are presented to practitioners for their factory applications.

    原文English
    頁(從 - 到)1003-1024
    頁數22
    期刊Journal of Applied Statistics
    32
    發行號10
    DOIs
    出版狀態Published - 1 十二月 2005

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