Testing methods for quaternary content addressable memory using charge-sharing sensing scheme

Hao Yu Yang, Rei Fu Huang, Chin Lung Su, Kuan Hong Lin, Hang Kaung Shu, Chi Wei Peng, Chia-Tso Chao

研究成果: Conference contribution同行評審

3 引文 斯高帕斯(Scopus)

摘要

Due to its capability of parallel search, content addressable memory (CAM) has been widely used on the applications requiring high-speed data search. In recent years, the architectures and design techniques for CAM have been consistently evolving. However, the incoming testing issues for those newly evolved CAM designs are not fully discussed. In this paper, we investigate the testing issues for a new 28nm quaternary CAM, which provides the additional fourth state compared to a conventional ternary CAM and utilizes a charge-sharing sensing scheme for reducing its search power consumption. We first identify the new fault models for this quaternary CAM that are not covered in the conventional CAM testing based on the simulation result, and derive the corresponding test algorithm for those new fault models. The effectiveness of the proposed test algorithm is then validated by the testing result of 7200 28nm sample chips covering different process corners with the help of a newly designed command-based memory BIST.

原文English
主出版物標題International Test Conference 2015, ITC 2015 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781467365789
DOIs
出版狀態Published - 30 11月 2015
事件46th IEEE International Test Conference, ITC 2015 - Anaheim, United States
持續時間: 6 10月 20158 10月 2015

出版系列

名字Proceedings - International Test Conference
2015-November
ISSN(列印)1089-3539

Conference

Conference46th IEEE International Test Conference, ITC 2015
國家/地區United States
城市Anaheim
期間6/10/158/10/15

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