Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs

Szu Pang Mu*, Yi Ming Wang, Hao Yu Yang, Chia-Tso Chao, Shi Hao Chen, Chih Mou Tseng, Tsung Ying Tsai

*此作品的通信作者

    研究成果: Conference contribution同行評審

    4 引文 斯高帕斯(Scopus)

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    Engineering & Materials Science