Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs

Szu Pang Mu*, Yi Ming Wang, Hao Yu Yang, Chia-Tso Chao, Shi Hao Chen, Chih Mou Tseng, Tsung Ying Tsai

*此作品的通信作者

    研究成果: Conference contribution同行評審

    4 引文 斯高帕斯(Scopus)

    摘要

    Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce ICs leakage power consumption by turning off idle devices with MTCMOS power switches. In this paper, we study the usage of coarse-grain MTCMOS power switches for both logic circuits and SRAMs, and then propose corresponding methods of testing stuck-open power switches for each of them. For logic circuits, a specialized ATPG framework is proposed to generate a longest possible robust test while creating as many effective transitions in the switch-centered region as possible. For SRAMs, a novel test algorithm is proposed to exercise the worstcase power consumption and performance when stuck-open power switches exist. The experimental results based on an industrial MTCMOS technology demonstrate the advantage of our proposed testing methods on detecting stuck-open power switches for both logic circuits and SRAMs, when compared to conventional testing methods.

    原文English
    主出版物標題2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
    發行者Institute of Electrical and Electronics Engineers Inc.
    頁面155-161
    頁數7
    ISBN(列印)9781424481927
    DOIs
    出版狀態Published - 2010
    事件2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 - San Jose, CA, United States
    持續時間: 7 11月 201011 11月 2010

    出版系列

    名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
    ISSN(列印)1092-3152

    Conference

    Conference2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
    國家/地區United States
    城市San Jose, CA
    期間7/11/1011/11/10

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