Test Methodology for Defect-based Bridge Faults

Yu Pang Hu, Shuo Wen Chang, Kai Chiang Wu, Chi Chun Wang, Fu Sheng Huang, Yi Lun Tang, Yung Chen Chen, Ming Chien Chen, Mango C.T. Chao

研究成果: Conference contribution同行評審

摘要

A defect-based bridge fault represents the faulty behavior of an interconnect short defect obtained by SPICE-simulating the two shorted cells with the short defect injected. In this paper, we have developed a framework to automatically extract defect-based bridge faults and utilize commercial ATPG to generate corresponding test patterns for a given design. Defect-based bridge fault model can not only describe the faulty behavior of a short defect precisely but also result in collapsible faults at one shorted cell pair. As a result, using defect-based bridge fault model for ATPG can lead to a significantly smaller bridge-fault test set when compared to conventional 4-way dominance bridge fault model, where four non-collapsible faults at one shorted cell pair are considered for ATPG. Also, some short defects can only be detected by the test set for defect-based bridge faults but not by the test set for 4-way dominance bridge faults with more test patterns. The experimental result based on industrial designs has demonstrated the effectiveness of using defect-based bridge faults for ATPG while showing an affordable runtime on extracting defect-based bridge faults.

原文English
主出版物標題Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
發行者Institute of Electrical and Electronics Engineers Inc.
頁面106-111
頁數6
ISBN(電子)9781728189444
DOIs
出版狀態Published - 9月 2020
事件4th IEEE International Test Conference in Asia, ITC-Asia 2020 - Taipei, Taiwan
持續時間: 23 9月 202025 9月 2020

出版系列

名字Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020

Conference

Conference4th IEEE International Test Conference in Asia, ITC-Asia 2020
國家/地區Taiwan
城市Taipei
期間23/09/2025/09/20

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