Test Generation for Defect-Based Faults of Scan Flip-Flops

Keyphrases

• Test Case Generation 100%
• Scan Flip-flop 100%
• Stuck-at 50%
• Cell-based 33%
• Transition Delay 33%
• Delay Patterns 33%
• Double Capture 33%
• Capture Mode 33%
• Fault Model 16%
• Test Pattern 16%
• Scanpath 16%
• Scan Cell 16%
• One-cycle 16%
• Static-dynamic 16%
• 2-cycles 16%
• Pattern Generation 16%
• Scan Chain 16%
• Fully Covered 16%
• Dynamic Shift 16%
• Five Cells 16%
• Transition Delay Fault 16%
• Static Shift 16%
• Single Capture 16%
• Fault Locating 16%

Computer Science

• Experimental Result 100%
• Test Generation 100%
• Scan Chain 100%

Engineering

• Flip Flop Circuits 100%
• Experimental Result 16%
• Fault Model 16%
• Scan Path 16%