Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

Riichiro Shirota*

*此作品的通信作者

研究成果: Conference article同行評審

1 引文 斯高帕斯(Scopus)

摘要

The test time of the memory chip is a very important issue. It depends on the program and erase time. NAND Flash memories perform high speed programming and erasing. Such devices perform accurately with the use of error chip collection (ECC) technology.

原文English
頁(從 - 到)1221
頁數1
期刊IEEE International Test Conference (TC)
DOIs
出版狀態Published - 2002
事件Proceedings International Test Conference - Baltimore, MD, United States
持續時間: 7 10月 200210 10月 2002

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