Ternary intermetallics Hf13.0Ni40.8Ga30.9 and Zr13.0Ni40.6Ga31.0

Wen Heng Huang, Chi-Shen Lee*

*此作品的通信作者

    研究成果: Article同行評審

    摘要

    Ternary compounds Hf13.0Ni40.8Ga30.9 and Zr13.0Ni40.6Ga31.0 were synthesized from the pure elements in arc-melting reactions; their structures were characterized through X-ray diffraction of single crystals. Each compound adopts a hexagonal structure of type Y13Pd40Sn31 and crystallizes in space group P6/mmm (No. 191). The cell parameters of Hf13.0Ni 40.8Ga30.9 are a = 17.895(3) ; c = 8.2434(16) ; V = 2286.0(6) 3; R1/wR2 = 0.0299/0.0598. The cell parameters of Zr13.0Ni40.6Ga31.0 are a = 17.964(3) ; c = 8.2757(17) ; V = 2312.7(7) 3; R1/wR 2 = 0.0348/0.0686. These structures comprise polyhedra with diverse coordination numbers - Hf 12-15, Ni and Ga 6-12. Analysis of the structures reveals layer frameworks based on structures of type CaCu5, accompanied with atomic substitution and elimination on the layers and decreased values of the concentration of valence electrons. Calculated electronic structures reveal a strong contribution from a Ni-Ga interaction and the characteristics of a polar intermetallic phase.

    原文English
    頁(從 - 到)1635-1641
    頁數7
    期刊Intermetallics
    19
    發行號11
    DOIs
    出版狀態Published - 1 十一月 2011

    指紋

    深入研究「Ternary intermetallics Hf<sub>13.0</sub>Ni<sub>40.8</sub>Ga<sub>30.9</sub> and Zr<sub>13.0</sub>Ni<sub>40.6</sub>Ga<sub>31.0</sub>」主題。共同形成了獨特的指紋。

    引用此