@inproceedings{0b042b60069045f598aad383c3c3c335,
title = "Temperature dependence of thin-film transistors electrical characteristics with multiple nano-wire channels",
abstract = "We have investigated the temperature dependent electrical characteristics of lightly-doped drain (LDD) polysilicon thin-film transistors (poly-Si TFTs) with a series of multi-channel with different widths from 25°C to 175°C. The ten 67 nm-wide split channels TFT has best transfer characteristics, because of it's robust trigate control and grain boundary defects is the lowest, due to its split nano-wires structure with effective NH3 plasma passivation.",
author = "Yang, {Che Yu} and Wu, {Yung Chun} and Chang, {Ting Chang} and Po-Tsun Liu and Chen, {Chi Shen} and Tu, {Chun Hao} and Chang, {Chun Yen}",
year = "2005",
month = feb,
language = "English",
isbn = "9572852221",
series = "International Display Manufacturing Conference and Exhibition, IDMC'05",
pages = "500--502",
editor = "{David Shieh}, H.P. and F.C. Chen",
booktitle = "Proceedings of the International Display Manufacturing Conference and Exhibition, IDMC'05",
note = "International Display Manufacturing Conference and Exhibition, IDMC'05 ; Conference date: 21-02-2005 Through 24-02-2005",
}