@inproceedings{ce2f9a59f164403aba6b4f682da9844e,
title = "System-level ESD protection design with on-chip transient detection circuit",
abstract = "A new on-chip transient detection circuit for systemlevel electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.",
author = "Yen, {Cheng Cheng} and Ming-Dou Ker and Shih, {Pi Chia}",
year = "2006",
doi = "10.1109/ICECS.2006.379864",
language = "English",
isbn = "1424403952",
series = "Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems",
pages = "616--619",
booktitle = "ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems",
note = "ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems ; Conference date: 10-12-2006 Through 13-12-2006",
}