Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su; Shyh Shen Hwang; Shyh-Jye Jou; Yuan Tzu Ting

doi:10.1109/ATS.1996.555138

Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su^*, Shyh Shen Hwang, Shyh-Jye Jou, Yuan Tzu Ting

^*此作品的通信作者

研究成果: Conference article › 同行評審

3 引文斯高帕斯（Scopus）

摘要

In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

原文	English
文章編號	5565433
頁（從 - 到）	62-67
頁數	6
期刊	Proceedings of the Asian Test Symposium
DOIs	https://doi.org/10.1109/ATS.1996.555138
出版狀態	Published - 1 12月 1996
事件	Proceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan 持續時間: 20 11月 1996 → 22 11月 1996

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10.1109/ATS.1996.555138

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abstract = "In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.",

author = "Chau-Chin Su and Hwang, {Shyh Shen} and Shyh-Jye Jou and Ting, {Yuan Tzu}",

year = "1996",

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AU - Jou, Shyh-Jye

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AB - In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

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Syndrome simulation and syndrome test for unscanned interconnects

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