Surface profiling measurement using varifocal lens based on focus stacking

Chen Liang Fan, Chun Jen Weng*, Yu Hsin Lin, Pi-Ying Cheng

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    In this study, we developed a 3D surface profiling technique based on a varifocal lens and focus-stacking method that uses a high-pass filter in conjunction with a focus algorithm. The varifocal lens was used in conjunction with a CCD camera to capture images of samples from various distances. The focus stacking method was then used to construct a surface profile and the image with large depth-of-filed.

    原文English
    主出版物標題I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference
    主出版物子標題Discovering New Horizons in Instrumentation and Measurement, Proceedings
    發行者Institute of Electrical and Electronics Engineers Inc.
    頁面1-5
    頁數5
    ISBN(電子)9781538622223
    DOIs
    出版狀態Published - 10 七月 2018
    事件2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 - Houston, United States
    持續時間: 14 五月 201817 五月 2018

    出版系列

    名字I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings

    Conference

    Conference2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018
    國家/地區United States
    城市Houston
    期間14/05/1817/05/18

    指紋

    深入研究「Surface profiling measurement using varifocal lens based on focus stacking」主題。共同形成了獨特的指紋。

    引用此