Suppressing the leakage on ain gate dielectrics and its application on low-voltage organic thin-film transistors

Hsiao-Wen Zan*, Kuo Hsi Yen, Chien Hsun Chen, Pu Kuan Liu, O. Hsin Ku, Jennchang Hwang

*此作品的通信作者

研究成果: Conference article同行評審

指紋

深入研究「Suppressing the leakage on ain gate dielectrics and its application on low-voltage organic thin-film transistors」主題。共同形成了獨特的指紋。

Keyphrases

Material Science