TY - GEN
T1 - Supply voltage assignment for power reduction in 3D ICs considering thermal effect and level shifter budget
AU - Whi, Shu Han
AU - Lee, Yu-Min
PY - 2011
Y1 - 2011
N2 - Few of existing works on power reduction in 3D ICs discuss the ability of supply voltage scaling techniques for power optimization. In this work, a supply voltage assignment based method for minimizing the power consumption of 3D ICs is presented. The proposed approach includes three major headings: (1) 3D IC Voltage Assignment for power reduction with including three factorssensitivity, proximity effect and level shifter (LS) budget; (2) 3D Electro-Thermal Analysis for the temperature distribution of 3D IC; (3) Thermal Aware Static Timing Analysis for thermal-related delay values of functional gates. The experimental results have shown a great power reduction by the proposed method.
AB - Few of existing works on power reduction in 3D ICs discuss the ability of supply voltage scaling techniques for power optimization. In this work, a supply voltage assignment based method for minimizing the power consumption of 3D ICs is presented. The proposed approach includes three major headings: (1) 3D IC Voltage Assignment for power reduction with including three factorssensitivity, proximity effect and level shifter (LS) budget; (2) 3D Electro-Thermal Analysis for the temperature distribution of 3D IC; (3) Thermal Aware Static Timing Analysis for thermal-related delay values of functional gates. The experimental results have shown a great power reduction by the proposed method.
UR - http://www.scopus.com/inward/record.url?scp=79959516955&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2011.5783562
DO - 10.1109/VDAT.2011.5783562
M3 - Conference contribution
AN - SCOPUS:79959516955
SN - 9781424484997
T3 - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
SP - 418
EP - 421
BT - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -