@inproceedings{e5187c1156cf4a2094590d46463d3157,
title = "Study on degradation of crystallized laterally grown poly-Si TFT under dynamic stress",
abstract = "The influence of protrusion grain boundary on the degradation of crystallized laterally grown poly-Si TFT under Dynamic Stress is investigated. The degradation of TFT with protrusion grain boundary is more severe and the different damage of the source/drain junction in the TFT with grain boundary closed to source side.",
author = "Lu, {Hau Yan} and Chung, {Wan Fang} and Tseng, {Tzu Yi} and Chen, {Yu G.} and Po-Tsun Liu and Chang, {Ting Chang} and Sien Chi",
year = "2007",
month = jul,
language = "English",
isbn = "9789572852248",
series = "IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings",
pages = "122--123",
booktitle = "IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings",
note = "International Display Manufacturing Conference and Exhibition, IDMC 2007 ; Conference date: 03-07-2007 Through 06-07-2007",
}