Study on degradation of crystallized laterally grown poly-Si TFT under dynamic stress

Hau Yan Lu*, Wan Fang Chung, Tzu Yi Tseng, Yu G. Chen, Po-Tsun Liu, Ting Chang Chang, Sien Chi

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

The influence of protrusion grain boundary on the degradation of crystallized laterally grown poly-Si TFT under Dynamic Stress is investigated. The degradation of TFT with protrusion grain boundary is more severe and the different damage of the source/drain junction in the TFT with grain boundary closed to source side.

原文English
主出版物標題IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings
頁面122-123
頁數2
出版狀態Published - 7月 2007
事件International Display Manufacturing Conference and Exhibition, IDMC 2007 - Taipei, Taiwan
持續時間: 3 7月 20076 7月 2007

出版系列

名字IDMC 2007 - International Display Manufacturing Conference and FPD Expo - Proceedings

Conference

ConferenceInternational Display Manufacturing Conference and Exhibition, IDMC 2007
國家/地區Taiwan
城市Taipei
期間3/07/076/07/07

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