TY - JOUR
T1 - Study of the optical response of phase-change recording layer with zinc oxide nanostructured thin film
AU - Kao, Tsung-Sheng
AU - Fu, Y. H.
AU - Hsu, H. W.
AU - Tsai, D. P.
PY - 2008/3/1
Y1 - 2008/3/1
N2 - Recently, use of nanostructured materials as a near-field optical active layer has attracted a lot of interest. The non-linear optical properties and strong enhancements of metallic oxide nanostructured thin films are key functions in applications of promising nanophotonics. For the importance of ultra-high density optical data storage, we continue investigating the ultra-high density recording property of near-field optical disk consisting of zinc oxide (ZnOx) nanostructured thin film. A carrier-to-noise ratio above 38 dB at a recording mark size of 100 nm can be obtained in the ZnO x near-field optical disk by a DVD driver tester directly. In this article, we use an optical pump-probe system (static media tester) to measure the optical response of a phase-change recording layer (Ge2Sb 2Te5) and demonstrate the high contrast of optical recording with a ZnOx nanostructured thin film in short pulse durations. Also, we investigate the dependence of writing power and the optical response in conventional re-writable recording layers and the phase-change material with ZnOx nanostructured thin film.
AB - Recently, use of nanostructured materials as a near-field optical active layer has attracted a lot of interest. The non-linear optical properties and strong enhancements of metallic oxide nanostructured thin films are key functions in applications of promising nanophotonics. For the importance of ultra-high density optical data storage, we continue investigating the ultra-high density recording property of near-field optical disk consisting of zinc oxide (ZnOx) nanostructured thin film. A carrier-to-noise ratio above 38 dB at a recording mark size of 100 nm can be obtained in the ZnO x near-field optical disk by a DVD driver tester directly. In this article, we use an optical pump-probe system (static media tester) to measure the optical response of a phase-change recording layer (Ge2Sb 2Te5) and demonstrate the high contrast of optical recording with a ZnOx nanostructured thin film in short pulse durations. Also, we investigate the dependence of writing power and the optical response in conventional re-writable recording layers and the phase-change material with ZnOx nanostructured thin film.
KW - Near-field optical disk
KW - Phase-change recording material
KW - Ultra-high density recording
KW - ZnO nanostructured thin film
UR - http://www.scopus.com/inward/record.url?scp=40549083321&partnerID=8YFLogxK
U2 - 10.1111/j.1365-2818.2008.01944.x
DO - 10.1111/j.1365-2818.2008.01944.x
M3 - Article
C2 - 18331511
AN - SCOPUS:40549083321
SN - 0022-2720
VL - 229
SP - 561
EP - 566
JO - Journal of Microscopy
JF - Journal of Microscopy
IS - 3
ER -