Study of hole concentration of 1,4-bis[N-(1-naphthyl)-N′-phenylamino] -4,4′ diamine doped with tungsten oxide by admittance spectroscopy

Ming Ta Hsieh*, Chan Ching Chang, Jenn-Fang Chen, Chin H. Chen

*此作品的通信作者

研究成果: Article同行評審

48 引文 斯高帕斯(Scopus)

摘要

The effect of tungsten oxide (WO3) incorporation into 1,4-bis[N-(1-naphthyl)-N′-phenylamino]-4,4′ diamine (NPB) layer is investigated in NPB-tris(8-hydroxyquinoline)aluminium heterojunction organic light-emitting diodes. The admittance spectroscopy studies show that increasing the WO3 volume percentage from 0% to 16% can increase the hole concentration of the NBP layer from 1.97 × 1014 to 1.90 × 1017 cm-3 and decrease the activation energy of the resistance of the NPB layer from 0.354 to 0.176 eV. Thus, this incorporation reduces the Ohmic loss and increases the band bending in the NBP layer near the interface, resulting in an improved hole injection via tunneling through a narrow depletion region.

原文English
文章編號103510
期刊Applied Physics Letters
89
發行號10
DOIs
出版狀態Published - 18 9月 2006

指紋

深入研究「Study of hole concentration of 1,4-bis[N-(1-naphthyl)-N′-phenylamino] -4,4′ diamine doped with tungsten oxide by admittance spectroscopy」主題。共同形成了獨特的指紋。

引用此